X-ray wavefront sensor development at the Advanced Light Source

Kenneth A. Goldberg; Antoine Wojdyla; Diane Bryant; Xianbo Shi; Luca Rebuffi; Matthew Frith; Matthew Highland; Lahsen Assoufid; Yoshio Ichii; Takato Inoue; Kazuto Yamauchi

doi:10.1117/12.2679136

3 October 2023 X-ray wavefront sensor development at the Advanced Light Source

Kenneth A. Goldberg, Antoine Wojdyla, Diane Bryant, Xianbo Shi, Luca Rebuffi, Matthew Frith, Matthew Highland, Lahsen Assoufid, Yoshio Ichii, Takato Inoue, Kazuto Yamauchi

Author Affiliations +

Proceedings Volume 12695, Advances in Metrology for X-Ray and EUV Optics X; 126950B (2023) https://doi.org/10.1117/12.2679136
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States

Abstract

At Lawrence Berkeley National Laboratory’s Advanced Light Source, we are developing x-ray wavefront sensors to support the creation and operation of beamlines with diffraction-limited quality. Our new approach to rapid, intermittent wavefront sensing operates in reflection at glancing incidence angles and is compatible with the high-power densities of modern beamlines. For soft x-ray applications especially, the wavefront sensor can operate upstream of the exit slit in a vertically dispersed beam. This single-shot technique supports lateral shearing interferometry and Hartmann wavefront sensing; it can be adapted to speckle-based techniques as well. The reflected beam is directed to an off-axis YAG crystal that produces scintillated visible light. A small mirror reflects the light to a microscope and camera, and the measured wavefront shape information can be used as feedback to adaptive x-ray mirror elements. A compact array of gratings enables measurement across a broad range of photon energies or wavefront curvatures. We describe recent demonstrations at soft x-ray and hard x-ray wavelengths measuring an adaptive x-ray mirror, and a toroidal focusing mirror.

Conference Presentation

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Kenneth A. Goldberg, Antoine Wojdyla, Diane Bryant, Xianbo Shi, Luca Rebuffi, Matthew Frith, Matthew Highland, Lahsen Assoufid, Yoshio Ichii, Takato Inoue, and Kazuto Yamauchi "X-ray wavefront sensor development at the Advanced Light Source", Proc. SPIE 12695, Advances in Metrology for X-Ray and EUV Optics X, 126950B (3 October 2023); https://doi.org/10.1117/12.2679136

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