1 August 1990 Optical characterization of low-absorbing thin films in the visible and infrared spectrum
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Proceedings Volume 1270, Optical Thin Films and Applications; (1990) https://doi.org/10.1117/12.20371
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands
Abstract
The optical characterization of thin films is a field of continuous investigation, nevertheless there is a lack of data of refractive indexes (n-ik) in the infrared spectrum. In this paper a method for the determination of the optical parameters n and k is described that starting from spectrophotometric measurements gives, by computer, the refractive index profile in a wide wavelength range. Y203, Al203, HfO2, ZnSe and ZnS are the examined film materials and their n and k values in the visible and infrared spectrum (0.35-20 m) are reported.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Enrico Masetti, Enrico Masetti, Angela M. Piegari, Angela M. Piegari, A. Tirabassi, A. Tirabassi, } "Optical characterization of low-absorbing thin films in the visible and infrared spectrum", Proc. SPIE 1270, Optical Thin Films and Applications, (1 August 1990); doi: 10.1117/12.20371; https://doi.org/10.1117/12.20371
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