1 August 1990 Optical characterization of low-absorbing thin films in the visible and infrared spectrum
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Proceedings Volume 1270, Optical Thin Films and Applications; (1990) https://doi.org/10.1117/12.20371
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands
Abstract
The optical characterization of thin films is a field of continuous investigation, nevertheless there is a lack of data of refractive indexes (n-ik) in the infrared spectrum. In this paper a method for the determination of the optical parameters n and k is described that starting from spectrophotometric measurements gives, by computer, the refractive index profile in a wide wavelength range. Y203, Al203, HfO2, ZnSe and ZnS are the examined film materials and their n and k values in the visible and infrared spectrum (0.35-20 m) are reported.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Enrico Masetti, Enrico Masetti, Angela M. Piegari, Angela M. Piegari, A. Tirabassi, A. Tirabassi, "Optical characterization of low-absorbing thin films in the visible and infrared spectrum", Proc. SPIE 1270, Optical Thin Films and Applications, (1 August 1990); doi: 10.1117/12.20371; https://doi.org/10.1117/12.20371
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