1 August 1990 Slow motion of domain walls in amorphous TbFe films
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Proceedings Volume 1274, Electro-Optic and Magneto-Optic Materials II; (1990) https://doi.org/10.1117/12.20507
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands
In r ec en t year s the amor phous r ar e ear th --t r an si t I on met al ( RE-TM) films have been extensively studied. A combination of structural, mag neti: and magnetooptical properties stimulate their application as media for reversal thermomagnetic recording. Of certain interest ic the investigation of physical properties of the films determining the processes of thermomaçjnetic writing and signal degradation. Investigation of the process of film remagnetiz4ticn is one of the tasks in this direction. It is known that the domain nucleation and th dorain wall moticn appear to be the major mechanisms of remagneti- zation process in thin RE--TM amorphous films'5 It has been shown th&: hcn the external magnetic field value is ncar the coercive force of the film, the magnetic aftereffect is observed, 6)? Since most of th RE-TM films exibit a characteristic feature that the remagnetiza- tion process proceeds due to the domain wall motion from relatively sn311 mourit of nuclei , the magnetic aftereffect was related with a slow domain wall motions The domain wall motion was considered as the thro:tivated process with the temperature dependence of the proba- bility 9 of Arrenius type8)9
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. G. Pokhil, B. S. Vvedensky, E. N. Nikolaev, "Slow motion of domain walls in amorphous TbFe films", Proc. SPIE 1274, Electro-Optic and Magneto-Optic Materials II, (1 August 1990); doi: 10.1117/12.20507; https://doi.org/10.1117/12.20507

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