1 August 1990 Residual rays as hardness indicators
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Proceedings Volume 1275, Hard Materials in Optics; (1990); doi: 10.1117/12.20522
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands
Abstract
An empirical relationship between the long wavelength edge of the residual ray band in the IRreflectance of partly ionic compounds and bulk hardness is demonstrated. The group of materials studied includes alkali halides, semi-conductors and some hard compounds, mostly with cubic structure and a few with hexagonal. The correlation is shown for the Young modulus, the melting temperature and also to some extent the indentation hardness. The Young moduli cover a range from 10 to almost 500 GPa and the melting temperatures vary from 600 to 3000°C.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Carl-Gustaf Ribbing, Klas Hjort, "Residual rays as hardness indicators", Proc. SPIE 1275, Hard Materials in Optics, (1 August 1990); doi: 10.1117/12.20522; https://doi.org/10.1117/12.20522
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KEYWORDS
Crystals

Reflectivity

Infrared radiation

Chemical species

Oscillators

Oxides

Silicate glass

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