Paper
28 July 2023 An intelligent defect detection method in solar cells via IDATLGAN
Bo Pang, Henan Bu, Changzhou Hu
Author Affiliations +
Proceedings Volume 12756, 3rd International Conference on Applied Mathematics, Modelling, and Intelligent Computing (CAMMIC 2023); 127562Y (2023) https://doi.org/10.1117/12.2686240
Event: 2023 3rd International Conference on Applied Mathematics, Modelling and Intelligent Computing (CAMMIC 2023), 2023, Tangshan, China
Abstract
Intelligent defect detection is a key section of the PDCA comprehensive quality management in the solar cells production. deep learning-based models for its powerful capacity of extracting features has successfully applied to defect detection tasks. Nevertheless, the deep learning-based models is susceptible to these problems such as insufficient labelled data and class imbalance, which deteriorates the performance of the deep models. What's worse, the new unknown defects without labels in the target domain tend to be recognized as the unknown defects in the source domain. To solve these problems, a novel method named IDATLGAN is proposed. Experimental results show that the proposed model outperforms the DCNN model in feature extraction ability and fulfil the transfer tasks even when faced with new unknown defects without labels.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bo Pang, Henan Bu, and Changzhou Hu "An intelligent defect detection method in solar cells via IDATLGAN", Proc. SPIE 12756, 3rd International Conference on Applied Mathematics, Modelling, and Intelligent Computing (CAMMIC 2023), 127562Y (28 July 2023); https://doi.org/10.1117/12.2686240
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KEYWORDS
Solar cells

Defect detection

Electroluminescence

Feature extraction

Data modeling

Education and training

Detection and tracking algorithms

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