Open Access Paper
12 July 2023 Evaluation of microlenses, color filters, and polarizing filters in CIS for space applications
P. Panuel, C. Durnez, C. Virmontois, A. Antonsanti, O. Saint-Pé, V. Lalucaa, E. Berdin, J.-M. Belloir, L. Chavanne
Author Affiliations +
Proceedings Volume 12777, International Conference on Space Optics — ICSO 2022; 1277714 (2023) https://doi.org/10.1117/12.2689263
Event: International Conference on Space Optics — ICSO 2022, 2022, Dubrovnik, Croatia
Abstract
For the last two decades, CNES optoelectronic detection department has studied and evaluated space environment effects on a large panel of CMOS image sensors (CIS), coming from a wide range of commercial foundries and device providers (cf. Table 1). Many environmental tests have been realized in order to bring insights on detection chain degradation in modern CIS for space applications (cf. Table 2). Thanks to their good electro-optical performances, high integration level, low power consumption and tolerance to the space radiation environment, CIS are more and more preferred over Charged Coupled Devices (CCD) in many future space imaging missions. Moreover, the CIS technology has drastically improved during the las decade, reaching very high performances in term of Quantum Efficiency (QE) and spectral selectivity. These improvements are obtained thanks to the introduction of various components in the pixel optical stack such as microlenses[1], color filters[2] and polarizing filters[3]. However, since these parts have been developed for a commercial purpose, it is crucial to evaluate if these technologies can handle space environment for future imaging missions and very few literatures exist on that robustness. Several space imaging systems have thus been able to benefit from these technologies on which these tests have been carried out, such as the Remote Micro-Imager (RMI) in the SuperCam instrument aboard the Mars 2020 rover Perseverance[4] . This CNES work demonstrates that these kinds of optical stacks show little variation in terms of efficiency when exposed to space environment. It also allowed studying the response of various optical systems at pixel level for various technologies such as microlenses, color filters and polarizing filters (shown respectively in Figures 1, 2 and 3). In the presentation, an overview of environmental tests results (cf. Table 2) on many CIS from different commercial technologies and several optical stacks are compared and show that they are suitable for space applications. Thanks to their robustness, they can significantly increase CIS performances without being a limiting path for them along the mission. Since the full paper containing data and more will be published later in MDPI Sensors[5] , it is on purpose that we prefer submitting a more consistent abstract with detailed Tables showing the amount of realized tests, and CNES photos of the optical stacks we are talking about. Additional presentation content can be accessed on the supplemental content page.

TABLE 1 –

Example of irradiation profiles performed on several technologies

Commercial CMOS imaging technologyTechnology node (nm)Pixel pitch (μm)IlluminationMicrolensesColor Filter ArrayPolarizing filtersParticle typeTotal Ionizing Dose (krad SiO2)Displacement Damage Dose (TeV/g Si)BiasRadiation Hardened
A.11805.5FSIYYN50 MeV p+563100groundedN
150 MeV p+21645grounded
B.11805FSIYNN50 MeV p+563100groundedN
150 MeV p+21645grounded
B.21807FSIYNNCo60 g100-biasedY
B.318010FSINYNCo60 g0.6 × 106-biasedY
B.418010FSINYN10 keV X1 × 106-biasedN
C.1653.45FSIYYN50 MeV3007560groundedN
p+Co60 g150grounded
C.2654.63BSIYYN50 MeV p+3007560groundedN
Co60 g150-grounded
C.3651.1BSIYYN62 MeV p+1002160groundedN
Co60 g1 × 103-grounded
C.4653.45FSIYNY50 MeV p+501930groundedN
Co60 g150-grounded
D.190 FEOL 65 BEOL13/26FSIYNN60 MeV p+10250groundedN
E.11102.8FSIYYN50 MeV p+1002510groundedN

Table 2 –

Environmental tests

Test typeTest characteristics
Humidity Cycling500 hours @ 70°C and 70% RH
Thermal Cycling50 cycles [-55°C / +125°C]
High Temperature Storage1000 hours @ 100°C
Vacuum1 week @ <10-6 Torr
UV48 hours @ 1 Solar Unit
Irradiations50 MeV p+ / 150 MeV p+
Physical analysisMicrosection, FTIR and cleaning solvent

Figure 1 –

SEM views of microlenses

00040_PSISDG12777_1277714_page_4_1.jpg

Figure 2 –

Microscope view of a Bayer Filter (Color Filter Array)

00040_PSISDG12777_1277714_page_5_1.jpg

Figure 3 –

SEM view of Polarizing grids (C.4 device)

00040_PSISDG12777_1277714_page_6_1.jpg

REFERENCES

[1] 

F. Zanella, G. Basset, C. Schneider, A. Luu-Dinh, S. Fricke, A. M. Madrigal, D. V. Aken, and M. Zahir, “Microlens testing on back-illuminated image sensors for space applications,” Appl. Opt., 59 (12), 3636 –3644 (2020) http://opg.optica.org/ao/abstract.cfm?URI=ao-59-12-3636 , Apr ). 2020). Google Scholar

[2] 

Sellier, C., et al., “Development and qualification of a miniaturised CMOS camera for space applications (3DCM734/3DCM739),” in International Conference on Space Optics—ICSO 2018, (2019). Google Scholar

[3] 

Lane, Connor, David Rode, and Thomas Rösgen, “Calibration of a polarization image sensor and investigation of influencing factors,” Applied Optics, 61.6 C37 –C45 (2022). https://doi.org/10.1364/AO.437391 Google Scholar

[4] 

S. Maurice, R. Wiens, P. Bernardi et al., “The SuperCam instrument suite on the mars 2020 rover: Science objectives and mast-unit description,” Space Sci. Rev., 217 (47), (2021). Google Scholar

[5] 

C. Durnez, P. Panuel, C. Virmontois, A. Antonsanti, O. Saint-Pé, V. Lalucaa, E. Berdin, J.-M. Belloir, L. Chavanne, “Evaluation of Microlenses, Color Filters and Polarizing Filters in CIS for Space Applications,” will be published in MDPI Sensors, Google Scholar
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Panuel, C. Durnez, C. Virmontois, A. Antonsanti, O. Saint-Pé, V. Lalucaa, E. Berdin, J.-M. Belloir, and L. Chavanne "Evaluation of microlenses, color filters, and polarizing filters in CIS for space applications", Proc. SPIE 12777, International Conference on Space Optics — ICSO 2022, 1277714 (12 July 2023); https://doi.org/10.1117/12.2689263
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KEYWORDS
Optical filters

Tunable filters

Microlens

Astronomical imaging

Environmental sensing

Image filtering

Image sensors

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