1 October 1990 X-ray and scanning electron microscope studies on electrodeposited ZnCdS semiconductor alloys
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Proceedings Volume 1284, Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors; (1990) https://doi.org/10.1117/12.20798
Event: Advances in Semiconductors and Superconductors: Physics Toward Devices Applications, 1990, San Diego, CA, United States
Abstract
ZnCdS semiconductor alloy films have been electrodeposited on conducting substrates. X-ray studies show polycrystalline nature exhibiting hexagonal structure for the solid solution. The lattice parameter variation obeys Vegard's law. SEM studies show decreasing grain size with increasing zinc content. Heat treated films show increased grain size thereby reducing grain boundary impurities. This lowers the resistivity of the deposited films.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Jayachandran, V. K. Venkatesan, T. Mahalingam, V. Vinni, "X-ray and scanning electron microscope studies on electrodeposited ZnCdS semiconductor alloys", Proc. SPIE 1284, Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors, (1 October 1990); doi: 10.1117/12.20798; https://doi.org/10.1117/12.20798
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