Poster + Paper
13 March 2024 Nanoscale fluctuation-enhanced axial localization microscopy integrated with metallic structure-assisted fluidic chips
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Conference Poster
Abstract
Optical super-resolution microscopy has revolutionized imaging in the lateral axis, enabling nanoscale structure visualization with unprecedented detail. However, achieving high axial resolution along the z-axis remains challenging. In this study, nanoscale fluctuation-enhanced axial localization microscopy addresses this issue by incorporating metallic structures, specifically reflective optical devices, into dynamic speckle illumination microscopy. By controlling light waves within the fluidic chip, these metallic devices enable super-resolution to be achieved not only in the lateral direction but also along the z-axis, all in a cost-effective manner. Experimental investigation using 100-nm fluorescent beads and the U-87 MG cell membrane demonstrates axial-resolving performance of fluctuation-enhanced imaging compared to conventional methods. The application of an optical fluctuation-based reconstruction algorithm further allows the extraction of 4-fold enhanced axial information over diffraction-limited system.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Hajun Yoo, Kwanhwi Ko, Sukhyeon Ka, Hyunwoong Lee, Seongmin Im, and Donghyun Kim "Nanoscale fluctuation-enhanced axial localization microscopy integrated with metallic structure-assisted fluidic chips", Proc. SPIE 12858, Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications XXI, 1285807 (13 March 2024); https://doi.org/10.1117/12.2690079
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KEYWORDS
Light sources and illumination

Speckle

Microscopy

Reflection

3D image processing

Super resolution

3D image reconstruction

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