Optical super-resolution microscopy has revolutionized imaging in the lateral axis, enabling nanoscale structure visualization with unprecedented detail. However, achieving high axial resolution along the z-axis remains challenging. In this study, nanoscale fluctuation-enhanced axial localization microscopy addresses this issue by incorporating metallic structures, specifically reflective optical devices, into dynamic speckle illumination microscopy. By controlling light waves within the fluidic chip, these metallic devices enable super-resolution to be achieved not only in the lateral direction but also along the z-axis, all in a cost-effective manner. Experimental investigation using 100-nm fluorescent beads and the U-87 MG cell membrane demonstrates axial-resolving performance of fluctuation-enhanced imaging compared to conventional methods. The application of an optical fluctuation-based reconstruction algorithm further allows the extraction of 4-fold enhanced axial information over diffraction-limited system.
|