Fluorescence rejection in Raman spectroscopy: an algorithmic approach and applications

Melissa J. Gelwicks; Celestine Zemtsop; Michael W. Allen

doi:10.1117/12.3000516

11 March 2024 Fluorescence rejection in Raman spectroscopy: an algorithmic approach and applications

Melissa J. Gelwicks, Celestine Zemtsop, Michael W. Allen

Proceedings Volume 12893, Photonic Instrumentation Engineering XI; 128930D (2024) https://doi.org/10.1117/12.3000516
Event: SPIE OPTO, 2024, San Francisco, California, United States

Abstract

For accurate Raman measurements, emission spectra must be free of fluorescence that obscures the critical information given by spectral “fingerprint” Raman peaks. The ideal Raman instrument can quickly and automatically generate a robust and fluorescence-free signal at the sampling point. Both mechanical and mathematical methods exist to reduce fluorescence, but with shortcomings and particular emphasis on spectral features. XTR is an algorithmic fluorescence-rejection technique that enhances the Raman spectrum for accurate analysis, identification, and verification of materials. Here, we present the fundamentals of the XTR method and provide application examples of XTR for identifying materials that have traditionally confounded Raman, like cellulose, oils, polymers, paints, and dyes.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Melissa J. Gelwicks, Celestine Zemtsop, and Michael W. Allen "Fluorescence rejection in Raman spectroscopy: an algorithmic approach and applications", Proc. SPIE 12893, Photonic Instrumentation Engineering XI, 128930D (11 March 2024); https://doi.org/10.1117/12.3000516

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