Presentation + Paper
13 March 2024 Intensity noise of mid-infrared semiconductor cascade lasers: exploring shot-noise-limited operation
Author Affiliations +
Abstract
In many precision sensing applications, the final detection sensitivity is tightly related to the intensity noise of the laser source, which might represent the ultimate limit to the sensor performance. In this framework, we present here the intensity noise characterization of three different mid-infrared semiconductor devices (two quantum cascade lasers and one interband cascade laser). A fast homemade balanced detection system is used to measure the intensity noise of the emitted radiation over a broad Fourier-frequency range, facilitating the observation of shot-noise-limited radiation under specific measurement conditions and detection efficiency. This study allows for a direct performance comparison of the most widespread laser sources in mid-infrared sensing systems.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Tecla Gabbrielli, Jacopo Pelini, Georg Marschick, Luigi Consolino, Irene La Penna, Jérôme Faist, Mathieu Bertrand, Filippos Kapsalidis, Robert Weih, Sven Höfling, Naota Akikusa, Borislav Hinkov, Francesco Cappelli, Paolo De Natale, and Simone Borri "Intensity noise of mid-infrared semiconductor cascade lasers: exploring shot-noise-limited operation", Proc. SPIE 12905, Novel In-Plane Semiconductor Lasers XXIII, 129050N (13 March 2024); https://doi.org/10.1117/12.3002416
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KEYWORDS
Quantum cascade lasers

Mid infrared

Quantum detection

Background noise

Quantum noise

Semiconductors

Laser radiation

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