The search for nano-scaled light sources and detectors, with an emission/absorption precisely controlled through the design of their morphology and structure, is fundamental for developing new synthesis and fabrication solutions in optoelectronics. In this context, a core-shell heterostructure with promising applications in telecommunications serves as an example to demonstrate the technical capabilities available at the hard x-ray nanoprobe beamline ID16B of the European Synchrotron Radiation Facility (ESRF) for characterizing optically active nanomaterials. The proposed case study focuses on an InGaAs/InP Multi-Quantum Well (MQW) structure grown with a perfectly hexagonal shape onto InP Nanowires (NWs). Nano-characterization, using a combination of X-Ray Fluorescence (XRF), X-ray Near Edge Spectroscopy (XANES), and X-ray Excited Optical Luminescence (XEOL) techniques, was conducted to locally probe the elemental homogeneity at the deep submicrometric scale and investigate the local optical properties and their correlations with the phase structure and defects.
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