Presentation + Paper
7 June 2024 III-V technology developments addressing a high operating temperature at LYNRED
Author Affiliations +
Abstract
Lynred is leading the development of infrared detectors for high performances applications. Two trends are identified in the infrared range, the increase of the operating temperature and the pixel pitch reduction. For 15 years, the III-V technologies present an increasing interest to address both challenges. At LYNRED, these technologies allow to address Short Wave InfraRed (SWIR) and Mid-Wave InfraRed (MWIR) for ground applications. Many challenges have to be addressed for the future focal plane arrays (FPAs). Electrical and optical crosstalks as well as image quality and stability, are one of the prime concern for detectors with pixel pitch down to 7.5μm. In order to reach an industrial production level of infrared FPAs, technological developments are required at each steps: the epitaxy, the detector array process, flip chip and back end processing. Another key element is the Read Out Integrated Circuit (ROIC) designed in-house to fulfil our customer needs.

We review the latest developments at LYNRED on III-V technologies, in terms of operability, residual fixed pattern noise (RFPN) and Modulation Transfer Function (MTF) optimizations.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
N. Péré-Laperne, A. Brunner, G. Dagher, A. Saintoyant, N. Morisset, L. Rubaldo, J. Coussement, A. Evirgen, J-L. Reverchon, B. Simozrag, M. Garcia, B. Gérard, C. Cervera, and O. Gravrand "III-V technology developments addressing a high operating temperature at LYNRED", Proc. SPIE 13046, Infrared Technology and Applications L, 1304614 (7 June 2024); https://doi.org/10.1117/12.3014159
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KEYWORDS
Staring arrays

Modulation transfer functions

Black bodies

Mid-IR

Readout integrated circuits

Image quality

Quantum noise

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