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1 October 1990 5-100GHz free-space microwave characterization setup
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Abstract
We have set up a state of the art free space measurement system for characterizing the electromagnetic reflection and transmission properties of planar samples in the 5-100 GHz frequency range for both normal and oblique incidence. The key components of the measurement system consists of two spot-focusing antennas mounted on circular tracks on a horizontal table, mode transitions, coaxial cables and a HP851OB network analyzer. The system is fully automated and has been calibrated to yield reliable and accurate values of free space S-parameters of planar samples. The complex electromagnetic properties (e. g., complex permittivity, complex permeability, etc.) of the sample can be measured as a function of frequency. The experimental results for teflon, a microwave ceramic material and silicon rubber-carbonyl iron composites are presented. Measurements can be done in a non-destructive and non-contact mode, that also permits material characterization under high temperature conditions.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vasundara V. Varadan, Vijay K. Varadan, and Deepak K. Ghodgaonkar "5-100GHz free-space microwave characterization setup", Proc. SPIE 1307, Electro-Optical Materials for Switches, Coatings, Sensor Optics, and Detectors, (1 October 1990); https://doi.org/10.1117/12.21657
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