High-resolution 2048 x 16 TDI PtSi IR imaging CCD

Marc T. Daigle; Don W. Colvin; Edward T. Nelson; Stuart Brickman; K. W. Wong; Shozo Yoshizumi; Michael B. Elzinga; Paul H. Sorlie; D. Rockafellow; Paul Travers; R. Avel

doi:10.1117/12.21720

1 September 1990 High-resolution 2048 x 16 TDI PtSi IR imaging CCD

Marc T. Daigle, Don W. Colvin, Edward T. Nelson, Stuart Brickman, K. W. Wong, Shozo Yoshizumi, Michael B. Elzinga, Paul H. Sorlie, D. Rockafellow, Paul Travers, R. Avel

Author Affiliations +

Proceedings Volume 1308, Infrared Detectors and Focal Plane Arrays; (1990) https://doi.org/10.1117/12.21720
Event: 1990 Technical Symposium on Optics, Electro-Optics, and Sensors, 1990, Orlando, FL, United States

Abstract

A 2048 x 16 pixel time delay and integrate (TDI) monolithic focal plane array detector using PtSi Schottky barrier photodiodes and an interline CCD architecture was developed. A high resolution was achieved by using 30-micron pixels, with a high sensitivity through the TDI mode of operation. A ripple clocked vertical shift register was used for higher charge capacity, allowing a 43-percent fill factor with a saturated charge capacity of 530,000 electrons.

Citation Download Citation

Marc T. Daigle, Don W. Colvin, Edward T. Nelson, Stuart Brickman, K. W. Wong, Shozo Yoshizumi, Michael B. Elzinga, Paul H. Sorlie, D. Rockafellow, Paul Travers, and R. Avel "High-resolution 2048 x 16 TDI PtSi IR imaging CCD", Proc. SPIE 1308, Infrared Detectors and Focal Plane Arrays, (1 September 1990); https://doi.org/10.1117/12.21720

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