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1 September 1990 High-resolution 2048 x 16 TDI PtSi IR imaging CCD
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Abstract
A 2048 x 16 pixel time delay and integrate (TDI) monolithic focal plane array detector using PtSi Schottky barrier photodiodes and an interline CCD architecture was developed. A high resolution was achieved by using 30-micron pixels, with a high sensitivity through the TDI mode of operation. A ripple clocked vertical shift register was used for higher charge capacity, allowing a 43-percent fill factor with a saturated charge capacity of 530,000 electrons.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marc T. Daigle, Don W. Colvin, Edward T. Nelson, Stuart Brickman, K. W. Wong, Shozo Yoshizumi, Michael B. Elzinga, Paul H. Sorlie, D. Rockafellow, Paul Travers, and R. Avel "High-resolution 2048 x 16 TDI PtSi IR imaging CCD", Proc. SPIE 1308, Infrared Detectors and Focal Plane Arrays, (1 September 1990); https://doi.org/10.1117/12.21720
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