1 October 1990 System response function: a new approach to minimize IR testing errors
Author Affiliations +
Abstract
Thermal Imaging Systems are characterized by various tests such as Minimum Resolvable Temperature (MRT), System Intensity Transfer Function (SITF) and Noise Equivalent Temperature Differential (NETD). Numerous sources of errors can effect these test giving misleading results. These error sources are analyzed and a new correction methodology is presented.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stephen W. McHugh, Stephen W. McHugh, Dave A. Gallinger, Dave A. Gallinger, Eden Y.C. Mei, Eden Y.C. Mei, } "System response function: a new approach to minimize IR testing errors", Proc. SPIE 1309, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing, (1 October 1990); doi: 10.1117/12.21781; https://doi.org/10.1117/12.21781
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT


Back to Top