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1 October 1990 Polarization properties of nonsymmetric retroreflectors
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Abstract
The on- and off-axis polarizing properties of asymmetric retroreflectors are studied in detail for various angles of incidence and for various incident linear polarization states. An analytic model is developed by applying Fresnel law to the incident and reflecting radiation on each facet of the retroreflector. It is shown that the polarization state of retroreflected radiation is a sensitive function of incident angle, incident polarization rate, and retroreflector material. These characteristics may be applicable to the determination of the relative angular position between the retroreflector and the analyzer.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chang-Hyuk An and John W. Morris "Polarization properties of nonsymmetric retroreflectors", Proc. SPIE 1317, Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray, (1 October 1990); https://doi.org/10.1117/12.22069
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