Resonance-ionization mass spectrometry for materials analysis and characterization

Nicholas S. Nogar; Ron C. Estler

doi:10.1117/12.22090

1 December 1990 Resonance-ionization mass spectrometry for materials analysis and characterization

Nicholas S. Nogar, Ron C. Estler

Proceedings Volume 1318, Optical Spectroscopic Instrumentation and Techniques for the 1990s: Applications in Astronomy, Chemistry, and Physics; (1990) https://doi.org/10.1117/12.22090
Event: Optical Spectroscopic Instrumentation and Techniques for the 1990s: Applications in Astronomy, Chemistry, and Physics, 1990, Las Cruces, NM, United States

Abstract

Resonance ionization mass spectrometry (RIMS) is an analytical tool discovered in the 1970's, developed primarily in the 1980's, and one which will undoubtedly see continued and expanding use through the 1990's. This technique combines laser ionization with mass spectrometric sorting and detection to yield analyses of unparalleled sensitivity and selectivity. We discuss the application of RIMS to the analysis of conventional analytical samples, as well as the combination of RIMS with laser or particle beam sputtering for the analysis of solids and surfaces with minimal sample preparation.

Citation Download Citation

Nicholas S. Nogar and Ron C. Estler "Resonance-ionization mass spectrometry for materials analysis and characterization", Proc. SPIE 1318, Optical Spectroscopic Instrumentation and Techniques for the 1990s: Applications in Astronomy, Chemistry, and Physics, (1 December 1990); https://doi.org/10.1117/12.22090

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