1 July 1990 Application of spatial filtering technique to automatic optical card inspection
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Proceedings Volume 1319, Optics in Complex Systems; (1990) https://doi.org/10.1117/12.34773
Event: 15th International Optics in Complex Systems, 1990, Garmisch, Germany
For the total system of optical cards defects on cards deteriorate their performance. We have developed an automatic inspection system of optical cards where we have applied spatial filtering technique to eliminate the periodic background pattern.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. Sato, T. Sato, F. Kimura, F. Kimura, Shigeru Izawa, Shigeru Izawa, S. Takahashi, S. Takahashi, Kashiko Kodate, Kashiko Kodate, Takeshi Kamiya, Takeshi Kamiya, } "Application of spatial filtering technique to automatic optical card inspection", Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.34773; https://doi.org/10.1117/12.34773

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