1 July 1990 Measurement of coating thickness by two-wavelength phase-shift method
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Proceedings Volume 1319, Optics in Complex Systems; (1990) https://doi.org/10.1117/12.34873
Event: 15th International Optics in Complex Systems, 1990, Garmisch, Germany
Abstract
The principLe of twowavelength phaseshift interferometry was described. Appling this method to the measurement of coating thickness of dichromated gelatin satisfied resuLts was obtained.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yueguang Lu, Yueguang Lu, Zhaoyue Pei, Zhaoyue Pei, Xia Zhao, Xia Zhao, Lingzhen Jiang, Lingzhen Jiang, Jing Hong, Jing Hong, } "Measurement of coating thickness by two-wavelength phase-shift method", Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.34873; https://doi.org/10.1117/12.34873
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