1 July 1990 Raman scattering and luminescence tomography
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Proceedings Volume 1319, Optics in Complex Systems; (1990) https://doi.org/10.1117/12.34748
Event: 15th International Optics in Complex Systems, 1990, Garmisch, Germany
Abstract
Three diaensional distribution of Cr ispurity and variation of intensity of LO phonon inside of ZnS0. 1Se0. 9 were observed clearly by Raman scattering and Luwinescence To. ography. 1.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. Sakai, Tomoya Ogawa, "Raman scattering and luminescence tomography", Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.34748; https://doi.org/10.1117/12.34748
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