1 July 1990 Shearing interferometer for testing wavefronts
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Proceedings Volume 1319, Optics in Complex Systems; (1990) https://doi.org/10.1117/12.22165
Event: 15th International Optics in Complex Systems, 1990, Garmisch, Germany
Abstract
Interferometric tests are widely used to test high precision optical systems. This kind of testing is about the only way to assure the desired accuracy and performance of those systems. In this paper a new lateral shearing interferometer (LSI) will be presented originally designed to test infinity corrected microscope objectives.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stefan M. B. Baumer, Stefan M. B. Baumer, Rainer Thieme, Rainer Thieme, } "Shearing interferometer for testing wavefronts", Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.22165; https://doi.org/10.1117/12.22165
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