Shearing interferometer for testing wavefront

Stefan M. B. Baumer; Rainer Thieme

doi:10.1117/12.22165

1 July 1990 Shearing interferometer for testing wavefronts

Stefan M. B. Baumer; Rainer Thieme

Author Affiliations +

Proceedings Volume 1319, Optics in Complex Systems; (1990) https://doi.org/10.1117/12.22165
Event: 15th International Optics in Complex Systems, 1990, Garmisch, Germany

Abstract

Interferometric tests are widely used to test high precision optical systems. This kind of testing is about the only way to assure the desired accuracy and performance of those systems. In this paper a new lateral shearing interferometer (LSI) will be presented originally designed to test infinity corrected microscope objectives.

Citation Download Citation

Stefan M. B. Baumer, Stefan M. B. Baumer, Rainer Thieme, Rainer Thieme, } "Shearing interferometer for testing wavefronts", Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.22165; https://doi.org/10.1117/12.22165

ACCESS THE FULL ARTICLE

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $14.40

Non-members: $18.00 ADD TO CART

Keywords/Phrases

Search In:

Publication Years