0.5 TO 2.0 Micrometer Spot Scan System

William D. Rogatto

doi:10.1117/12.956057

6 June 1978 0.5 TO 2.0 Micrometer Spot Scan System

William D. Rogatto

Proceedings Volume 0132, Utilization of Infrared Detectors; (1978) https://doi.org/10.1117/12.956057
Event: 1978 Los Angeles Technical Symposium, 1978, Los Angeles, United States

Abstract

A system to evaluate photodetectors sensitive in the 0.5 to 2.0 micrometer spectral band has been designed, fabricated and calibrated. The system consists of a spot scanner which is controlled by a desk top calculator. Responsivity data is sampled and processed by the calculator. The system is used to evaluate photodetectors for uniformity of responsivity, quantum efficiency, optical area and crosstalk.

Citation Download Citation

William D. Rogatto "0.5 TO 2.0 Micrometer Spot Scan System", Proc. SPIE 0132, Utilization of Infrared Detectors, (6 June 1978); https://doi.org/10.1117/12.956057

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