PROCEEDINGS VOLUME 1323
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING | 8-13 JULY 1990
Optical Thin Films III: New Developments
IN THIS VOLUME

5 Sessions, 35 Papers, 0 Presentations
Active Films  (7)
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING
8-13 July 1990
San Diego, CA, United States
New Deposition Techniques
Proc. SPIE 1323, Optical thin-film technology: past, present, future, 0000 (1 December 1990); doi: 10.1117/12.22367
Proc. SPIE 1323, Cluster size in ionized cluster beam deposition, 0000 (1 December 1990); doi: 10.1117/12.22368
Proc. SPIE 1323, Ion currents and energies in reactive low-voltage ion plating: preliminary results, 0000 (1 December 1990); doi: 10.1117/12.22369
Proc. SPIE 1323, Recent advances in reactive low-voltage ion-plating deposition, 0000 (1 December 1990); doi: 10.1117/12.22370
Proc. SPIE 1323, Radio frequency and microwave plasma for optical thin-film deposition, 0000 (1 December 1990); doi: 10.1117/12.22371
Proc. SPIE 1323, Optical and electrical properties of transition metal nitride films produced by reactive cathodic arc deposition and reactive rf sputtering, 0000 (1 December 1990); doi: 10.1117/12.22372
Proc. SPIE 1323, Electron-rain-assisted deposition of optical thin films, 0000 (1 December 1990); doi: 10.1117/12.22373
Proc. SPIE 1323, Effect of ion-assisted deposition on optical properties of thin films, 0000 (1 December 1990); doi: 10.1117/12.22374
New Applications
Proc. SPIE 1323, Optical coatings for automobiles, 0000 (1 December 1990); doi: 10.1117/12.22375
Proc. SPIE 1323, Plasma-enhanced CVD hard coatings for opthalmic optics, 0000 (1 December 1990); doi: 10.1117/12.22376
Proc. SPIE 1323, Optically variable films, pigments, and inks, 0000 (1 December 1990); doi: 10.1117/12.22377
Proc. SPIE 1323, Simple antireflection coatings for cathode ray tube and other display devices, 0000 (1 December 1990); doi: 10.1117/12.22378
Proc. SPIE 1323, MetaMode: a new method for high-rate MetaMode reactive sputtering, 0000 (1 December 1990); doi: 10.1117/12.22379
Proc. SPIE 1323, Thin-film coatings for flexible optical data storage, 0000 (1 December 1990); doi: 10.1117/12.22380
Proc. SPIE 1323, Multilayer thin-film media for optical recording, 0000 (1 December 1990); doi: 10.1117/12.22381
Proc. SPIE 1323, Production of magneto-optical data storage media by static DC sputter processes, 0000 (1 December 1990); doi: 10.1117/12.22382
Active Films
Proc. SPIE 1323, Thin films for active optics, 0000 (1 December 1990); doi: 10.1117/12.22383
Proc. SPIE 1323, Electrochromics and potential automotive applications, 0000 (1 December 1990); doi: 10.1117/12.22384
Proc. SPIE 1323, Electrochromic films involving Prussian blue and viologen materials, 0000 (1 December 1990); doi: 10.1117/12.22387
Proc. SPIE 1323, Optical, thermal, and electronic semiconductor properties of thermochromic metal halides, 0000 (1 December 1990); doi: 10.1117/12.22388
Proc. SPIE 1323, Herpin equivalents in magneto-optics: a magneto-optic layer sandwiched between two dielectric layers, 0000 (1 December 1990); doi: 10.1117/12.22392
Proc. SPIE 1323, Photoconducting and photoelectrochemical characteristics of selectively plated cadmium selenide films, 0000 (1 December 1990); doi: 10.1117/12.22393
Characterization and Properties
Proc. SPIE 1323, Thermal properties of optical thin-film materials, 0000 (1 December 1990); doi: 10.1117/12.22394
Proc. SPIE 1323, Minimizing defects in infrared coatings on silicon, 0000 (1 December 1990); doi: 10.1117/12.22396
Proc. SPIE 1323, Mechanical properties of thin films on substrates, 0000 (1 December 1990); doi: 10.1117/12.22398
Proc. SPIE 1323, Ion-beam-sputtered metal fluorides, 0000 (1 December 1990); doi: 10.1117/12.22399
Proc. SPIE 1323, Properties of reactively deposited SiC and GeC alloys, 0000 (1 December 1990); doi: 10.1117/12.22400
Proc. SPIE 1323, Medium energy backscattering spectrometry: a new tool for characterizing optical thin films, 0000 (1 December 1990); doi: 10.1117/12.22401
Proc. SPIE 1323, Automated precision reflectometer for first-surface mirrors I: optical head, 0000 (1 December 1990); doi: 10.1117/12.22403
Proc. SPIE 1323, Automated precision reflectometer for first-surface mirrors II: system, 0000 (1 December 1990); doi: 10.1117/12.22404
Proc. SPIE 1323, Some physical properties and microstructure of titania films doped with multielement, 0000 (1 December 1990); doi: 10.1117/12.22405
General Topics
Proc. SPIE 1323, Method of monitoring nonquarter-wavelength film thickness by turning point, 0000 (1 December 1990); doi: 10.1117/12.22406
Proc. SPIE 1323, Dependence of precursor chemistry and curing conditions on optical loss characteristics of polyimide waveguides, 0000 (1 December 1990); doi: 10.1117/12.22408
Proc. SPIE 1323, Investigation of tellurium thin films for IR-integrated waveguides and CO2 laser detection, 0000 (1 December 1990); doi: 10.1117/12.22409
Active Films
Proc. SPIE 1323, Deposition methods and process techniques for the fabrication of electrochromic all-solid-state devices, 0000 (1 December 1990); doi: 10.1117/12.22410
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