1 December 1990 Investigation of tellurium thin films for IR-integrated waveguides and CO2 laser detection
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Abstract
Mode concentration and propagation constants in Te thin film structures are readily obtained from a transverse resonant method without explicit knowledge of the dispersion relationship from Maxwell's equations. Losses involved, best method of coupling a light beam into a Te thin-film waveguide, non linear Te-X-junctions, bends co and contradirectional coupling, second order harmonic generation (SHG) in a Te Waveguide structure, are briefly discussed. Finally the measured optimized detection characteristics of Te/Si thin film device and the proposed theory of the detection mechanism yield to consider Te thin-films as a potenthlly improved room temperature pulsed C02 laser detector.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dominique Jacques Souilhac, Arshavir Gundjian, M. Badaye, Dominique Billerey, "Investigation of tellurium thin films for IR-integrated waveguides and CO2 laser detection", Proc. SPIE 1323, Optical Thin Films III: New Developments, (1 December 1990); doi: 10.1117/12.22409; https://doi.org/10.1117/12.22409
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KEYWORDS
Tellurium

Thin films

Waveguides

Crystals

Thin film devices

Sensors

Silicon

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