PROCEEDINGS VOLUME 1324
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING | 8-13 JULY 1990
Modeling of Optical Thin Films II
IN THIS VOLUME

6 Sessions, 24 Papers, 0 Presentations
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING
8-13 July 1990
San Diego, CA, United States
Invited Papers
Proc. SPIE 1324, Revisiting structure zone models for thin film growth, 0000 (1 December 1990); https://doi.org/10.1117/12.22411
Proc. SPIE 1324, Effects of surface diffusion on thin-film morphology: a computer study, 0000 (1 December 1990); https://doi.org/10.1117/12.22412
Proc. SPIE 1324, Unusual fluorination effects on superconducting films, 0000 (1 December 1990); https://doi.org/10.1117/12.22413
Process Parameter Models
Proc. SPIE 1324, Source emission pattern polynomial representation, 0000 (1 December 1990); https://doi.org/10.1117/12.22415
Proc. SPIE 1324, Knowledge-based optical coatings design and manufacturing, 0000 (1 December 1990); https://doi.org/10.1117/12.22416
Proc. SPIE 1324, Computer-optimized optical monitoring wavelengths, 0000 (1 December 1990); https://doi.org/10.1117/12.22417
Proc. SPIE 1324, Improved sensitivity in ellipsometry of thin biochemical films by employing sublayers, 0000 (1 December 1990); https://doi.org/10.1117/12.22418
Proc. SPIE 1324, Interaction between dispersive and inhomogeneous models for interpreting spectral ellipsometric data of thin films, 0000 (1 December 1990); https://doi.org/10.1117/12.22419
Film Growth Models
Proc. SPIE 1324, Nucleation and growth of thin films, 0000 (1 December 1990); https://doi.org/10.1117/12.22420
Proc. SPIE 1324, Simulation of the early stages of thin film formation and columnar growth, 0000 (1 December 1990); https://doi.org/10.1117/12.22421
Proc. SPIE 1324, Ballistic simulation of optical coatings deposited over topography, 0000 (1 December 1990); https://doi.org/10.1117/12.22422
Proc. SPIE 1324, Molecular-dynamics simulation of thin-film growth and relaxation, 0000 (1 December 1990); https://doi.org/10.1117/12.22424
Proc. SPIE 1324, Simulations of glass surfaces-structure, water adsorption, and bond rupture, 0000 (1 December 1990); https://doi.org/10.1117/12.22425
Film Microstructure
Proc. SPIE 1324, Theoretical distribution of the structural uniformity of the vapor-deposited thin films, 0000 (1 December 1990); https://doi.org/10.1117/12.22426
Proc. SPIE 1324, Inhomogeneity in layers of dielectric high index materials: a simplified study for an antireflection coating, 0000 (1 December 1990); https://doi.org/10.1117/12.22427
Proc. SPIE 1324, Structure-related anisotropic index of the optical thin films, 0000 (1 December 1990); https://doi.org/10.1117/12.22428
Proc. SPIE 1324, Method to destroy the columnar structure of optical thin films, 0000 (1 December 1990); https://doi.org/10.1117/12.22429
Film Property Models I
Proc. SPIE 1324, Study of stresses in optical thin films by optical fiber technology, 0000 (1 December 1990); https://doi.org/10.1117/12.22430
Proc. SPIE 1324, Stress-related phenomena in reactively dc magnetron sputtered aluminum nitride thin films, 0000 (1 December 1990); https://doi.org/10.1117/12.22431
Proc. SPIE 1324, Hole burning in multilayer structures: effect of the third order susceptibility, 0000 (1 December 1990); https://doi.org/10.1117/12.22432
Proc. SPIE 1324, Anisotropic dispersion and inhomogeneous dispersion in the evaporated thin films, 0000 (1 December 1990); https://doi.org/10.1117/12.22433
Film Property Models II
Proc. SPIE 1324, Modeling the properties of unbacked thin films, 0000 (1 December 1990); https://doi.org/10.1117/12.22434
Proc. SPIE 1324, Structural refinement of superlattices from x-ray diffraction, 0000 (1 December 1990); https://doi.org/10.1117/12.22435
Proc. SPIE 1324, Optical modeling of mixed dielectric/metal media multilayers, 0000 (1 December 1990); https://doi.org/10.1117/12.22436
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