The cylindrical model of optical thin films microstructure is assumed for the derivation of the
equations expressing the structure-dependent anisotropic optical parameters in this paper. The
equations are given for various values of cylinder obliquity and for several incident plane
orientations. The equations are based on a capacitive model in which two index components are
given and on the dielectric ellipsoid theory. They are applied to modeling ZnS thin films and the
computed results have been given. We discuss the results, especially noting consistency of our
model-based computations with measurements.