1 December 1990 Study of stresses in optical thin films by optical fiber technology
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Abstract
In-situ measuring the intensity and characteristics stresses in optical coatings during deposition can get a lot of important information for improving the properties of optical thin films, which is more important for some devices uesd in modern science and technology. This paper gives a new method which uses a kind of most in-fashion sensing technology, a single-mode optical fiber sensing system developed in the middle of 1900s to test the stresses in optical coatings during deposition with the aid of a single-chip micro-computer and a micro-printer. The experimental results show that this method takes advantages of high sensitivity wide dynamic range, small volume, available in-situ measurement and easily interfaced to any vacuum system.
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Shouyao Sun, Shouyao Sun, Jiu Lin Zhou, Jiu Lin Zhou, Xuequan Zan, Xuequan Zan, } "Study of stresses in optical thin films by optical fiber technology", Proc. SPIE 1324, Modeling of Optical Thin Films II, (1 December 1990); doi: 10.1117/12.22430; https://doi.org/10.1117/12.22430
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