1 December 1990 Infrared measurements of CVD diamond films
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Abstract
The growth surfaces of CVD diamond films are usually rough with polycrystalline crystallographic habits which presents a severe problem if CVD diamond films are to be used in infrared optics. Several methods are described in this paper in an effort to solve this problem. A polishing process was used to reduce the surface roughness by polishing the rough growth surface with a heated cast iron scaife. For polished films, near 70% transmittance was obtained over the whole range of 600-4000 cm-1, while the transmittance for non-polished films were much lower and varied strongly with the wavenumber. Absorptions believed due to carbon-hydrogen stretching bands and a silicon carbide phase were observed in the transmission spectra of polished diamond films.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiao-Hong Wang, Xiao-Hong Wang, Lawrence J. Pilione, Lawrence J. Pilione, Wei Zhu, Wei Zhu, Walter A. Yarbrough, Walter A. Yarbrough, W. R. Drawl, W. R. Drawl, Russell F. Messier, Russell F. Messier, } "Infrared measurements of CVD diamond films", Proc. SPIE 1325, Diamond Optics III, (1 December 1990); doi: 10.1117/12.22455; https://doi.org/10.1117/12.22455
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