1 October 1990 Infrared transparent conductive diffused layers in germanium windows
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Abstract
Infrared transparent conductive diffused layers have been integrated into germanium windows using an ion- implantation/diffusion technique. These layers are nominally 25 microns thick with sheet resistivities of 5-10 ohms/square. The excellent transmission characteristics of the germanium windows are maintained, with maximum transmission degradation of only 3 and 5% in the 3-5 and 8-12 micron bandpasses, respectively.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael R. Borden, Michael R. Borden, } "Infrared transparent conductive diffused layers in germanium windows", Proc. SPIE 1326, Window and Dome Technologies and Materials II, (1 October 1990); doi: 10.1117/12.22487; https://doi.org/10.1117/12.22487
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