1 October 1990 Infrared transparent conductive diffused layers in germanium windows
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Abstract
Infrared transparent conductive diffused layers have been integrated into germanium windows using an ion- implantation/diffusion technique. These layers are nominally 25 microns thick with sheet resistivities of 5-10 ohms/square. The excellent transmission characteristics of the germanium windows are maintained, with maximum transmission degradation of only 3 and 5% in the 3-5 and 8-12 micron bandpasses, respectively.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael R. Borden, "Infrared transparent conductive diffused layers in germanium windows", Proc. SPIE 1326, Window and Dome Technologies and Materials II, (1 October 1990); doi: 10.1117/12.22487; https://doi.org/10.1117/12.22487
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