PROCEEDINGS VOLUME 1329
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING | 8-13 JULY 1990
Optical System Contamination: Effects, Measurement, Control II
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING
8-13 July 1990
San Diego, CA, United States
Contamination Effects on Spaceborne Optical Instruments
Proc. SPIE 1329, Overview of contamination effects on the performance of high-straylight-rejection telescopes via ground measurements, 0000 (1 November 1990); doi: 10.1117/12.22587
Proc. SPIE 1329, Science objectives lead to contamination requirements for the Cosmic Background Explorer, 0000 (1 November 1990); doi: 10.1117/12.22588
Proc. SPIE 1329, Contamination control program results from three years of ground operations on the Extreme Ultraviolet Explorer instruments, 0000 (1 November 1990); doi: 10.1117/12.22589
Proc. SPIE 1329, Contamination control of the Cryogenic Limb Array Etalon Spectrometer, 0000 (1 November 1990); doi: 10.1117/12.22590
Proc. SPIE 1329, Analysis and interpretation of Wide-Field Planetary Camera outgas data collected in the temperature range from -20 degrees C to -100 degrees C, 0000 (1 November 1990); doi: 10.1117/12.22591
Proc. SPIE 1329, Strategy for contamination control to improve Wide-Field Planetary Camera far-ultraviolet performance, 0000 (1 November 1990); doi: 10.1117/12.22592
Noncontact Techniques for Cleaning Optical Surfaces
Proc. SPIE 1329, Contamination removal by ion sputtering, 0000 (1 November 1990); doi: 10.1117/12.22594
Proc. SPIE 1329, Laser cleaning of cryogenic optics, 0000 (1 November 1990); doi: 10.1117/12.22595
Proc. SPIE 1329, Ion-beam cleaning of contaminated optics, 0000 (1 November 1990); doi: 10.1117/12.22596
Proc. SPIE 1329, Analysis of mirror surface after laser or ion removal of contaminants, 0000 (1 November 1990); doi: 10.1117/12.22597
Proc. SPIE 1329, Ultraviolet laser cleaning of mirrored surfaces, 0000 (1 November 1990); doi: 10.1117/12.22598
Proc. SPIE 1329, Contamination removal by CO2 jet spray, 0000 (1 November 1990); doi: 10.1117/12.22599
Contamination Measurement Techniques
Proc. SPIE 1329, Nonoptical real-time particle fallout monitor, 0000 (1 November 1990); doi: 10.1117/12.22600
Proc. SPIE 1329, 200-MHz surface acoustic wave mass microbalance, 0000 (1 November 1990); doi: 10.1117/12.22601
Proc. SPIE 1329, Tests of a 200-mhz surface acoustic wave mass monitor in a space environment, 0000 (1 November 1990); doi: 10.1117/12.34753
Proc. SPIE 1329, Total integrated scatter instrument for in-space monitoring of surface degradation, 0000 (1 November 1990); doi: 10.1117/12.22603
Proc. SPIE 1329, Ultrasensitive dust monitor for the Advanced X-Ray Astrophysics Facility, 0000 (1 November 1990); doi: 10.1117/12.22604
Proc. SPIE 1329, Optical scatter and contamination effects facility, 0000 (1 November 1990); doi: 10.1117/12.22605
Proc. SPIE 1329, JPL Molecular Contamination Investigation Facility, 0000 (1 November 1990); doi: 10.1117/12.22606
Characterization of Contaminants
Proc. SPIE 1329, Mirror-scatter degradation by particulate contamination, 0000 (1 November 1990); doi: 10.1117/12.22607
Proc. SPIE 1329, BRDF measurements for contamination assessment in a spacecraft environment, 0000 (1 November 1990); doi: 10.1117/12.22609
Proc. SPIE 1329, New screening methodology to select low outgassing materials for cold, spaceborne optical instruments, 0000 (1 November 1990); doi: 10.1117/12.22610
Proc. SPIE 1329, Ambient pressure offgassing apparatus for screening materials utilized in environments supporting optical spaceborne systems, 0000 (1 November 1990); doi: 10.1117/12.22611
Proc. SPIE 1329, Spacecraft contamination database, 0000 (1 November 1990); doi: 10.1117/12.22612
Contamination Transport and Interactions with Space Systems
Proc. SPIE 1329, BGK method to determine thruster plume backscatter, 0000 (1 November 1990); doi: 10.1117/12.22613
Proc. SPIE 1329, Surface accommodation of molecular contaminants, 0000 (1 November 1990); doi: 10.1117/12.22614
Proc. SPIE 1329, Modeling of internal contaminant deposition on a cold instrument sensor, 0000 (1 November 1990); doi: 10.1117/12.22615
Proc. SPIE 1329, Infrared emission from the reaction of orbital velocity atomic oxygen with hydrocarbon materials, 0000 (1 November 1990); doi: 10.1117/12.22616
Proc. SPIE 1329, Role of low-energy neutral N2 beam-surface interactions leading to spacecraft glow, 0000 (1 November 1990); doi: 10.1117/12.22617
Proc. SPIE 1329, Laboratory study of electrostatic charging of contaminated Ulysses spacecraft thermal blankets, 0000 (1 November 1990); doi: 10.1117/12.22618
Characterization of Contaminants
Proc. SPIE 1329, Optical effects of photochemically deposited contaminant films, 0000 (1 November 1990); doi: 10.1117/12.22619
Noncontact Techniques for Cleaning Optical Surfaces
Proc. SPIE 1329, Laser-mirror cleaning in a simulated space environment, 0000 (1 November 1990); doi: 10.1117/12.22621
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