1 November 1990 Ion-beam cleaning of contaminated optics
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Recent results on ion beam cleaning experiments of super-polished cryogenic mirrors are presented. A variety of contaminants such as air, water, ammonia, and hexane have been studied and some of the experimental parameters necessary to remove these were determined. The mirrors were exposed to a controlled amount of a known contaminant and/or mixtures of known contaminants. Dual-wavelength (0.633- and 10.6-micron) bidirectional reflectance distribution function measurements were made on the clean, contaminated and ion beam cleaned surfaces. These data, along with quartz crystal microbalance measurements and mass spectroscopic data, are used to compare the effect of contaminants and ion beam removal of these contaminants on the scatter properties of various mirror surfaces.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert F. Fisher, Robert F. Fisher, Patricia M. Beauchamp, Patricia M. Beauchamp, Steven M. Flammang, Steven M. Flammang, Timothy L. Howard, Timothy L. Howard, "Ion-beam cleaning of contaminated optics", Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); doi: 10.1117/12.22596; https://doi.org/10.1117/12.22596

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