High-resolution spectral reflection measurements on selected optical-black baffle coatings in the 5-20 um region

Christopher W. Brown; Donald R. Smith

doi:10.1117/12.22666

1 December 1990 High-resolution spectral reflection measurements on selected optical-black baffle coatings in the 5-20 μm region

Christopher W. Brown, Donald R. Smith

Author Affiliations +

Proceedings Volume 1331, Stray Radiation in Optical Systems; (1990) https://doi.org/10.1117/12.22666
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The high-resolution (4 cm1) spectral characteristics of radiation specularly reflected and diffusely scattered from selected optical-black coatings in the infrared from 5 to 20 microns are reported. Various one-, two- and three-coat samples were measured for numerous combinations of incident and output angles. Many spectra show a surprising number of strong, sharp features, especially in the specular direction. The results for several commercially available and widely used black coatings are compared and interpreted.

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Christopher W. Brown and Donald R. Smith "High-resolution spectral reflection measurements on selected optical-black baffle coatings in the 5-20 μm region", Proc. SPIE 1331, Stray Radiation in Optical Systems, (1 December 1990); https://doi.org/10.1117/12.22666

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