1 December 1990 High-resolution spectral reflection measurements on selected optical-black baffle coatings in the 5-20 μm region
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Abstract
The high-resolution (4 cm1) spectral characteristics of radiation specularly reflected and diffusely scattered from selected optical-black coatings in the infrared from 5 to 20 microns are reported. Various one-, two- and three-coat samples were measured for numerous combinations of incident and output angles. Many spectra show a surprising number of strong, sharp features, especially in the specular direction. The results for several commercially available and widely used black coatings are compared and interpreted.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christopher W. Brown, Christopher W. Brown, Donald R. Smith, Donald R. Smith, } "High-resolution spectral reflection measurements on selected optical-black baffle coatings in the 5-20 μm region", Proc. SPIE 1331, Stray Radiation in Optical Systems, (1 December 1990); doi: 10.1117/12.22666; https://doi.org/10.1117/12.22666
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