PROCEEDINGS VOLUME 1332
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING | 8-13 JULY 1990
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING
8-13 July 1990
San Diego, CA, United States
Testing of Optical Components and Systems
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 2 (1 January 1991); doi: 10.1117/12.51045
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 8 (1 January 1991); doi: 10.1117/12.51046
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 18 (1 January 1991); doi: 10.1117/12.51047
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 36 (1 January 1991); doi: 10.1117/12.51048
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 41 (1 January 1991); doi: 10.1117/12.51049
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 50 (1 January 1991); doi: 10.1117/12.51050
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 56 (1 January 1991); doi: 10.1117/12.51051
Testing of Aspheric and Generalized Surfaces
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 66 (1 January 1991); doi: 10.1117/12.51052
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 77 (1 January 1991); doi: 10.1117/12.51053
Specialized Techniques and Applications II
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 843 (1 January 1991); doi: 10.1117/12.51061
Testing of Aspheric and Generalized Surfaces
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 97 (1 January 1991); doi: 10.1117/12.51062
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 107 (1 January 1991); doi: 10.1117/12.51063
Holography and Holographic Interferometry
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 122 (1 January 1991); doi: 10.1117/12.51064
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 132 (1 January 1991); doi: 10.1117/12.51065
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 142 (1 January 1991); doi: 10.1117/12.51066
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 151 (1 January 1991); doi: 10.1117/12.51067
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 185 (1 January 1991); doi: 10.1117/12.51068
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 193 (1 January 1991); doi: 10.1117/12.51069
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 205 (1 January 1991); doi: 10.1117/12.51070
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 216 (1 January 1991); doi: 10.1117/12.51071
Holography and Phase Conjunction
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 224 (1 January 1991); doi: 10.1117/12.51072
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 230 (1 January 1991); doi: 10.1117/12.51073
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 236 (1 January 1991); doi: 10.1117/12.51074
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 245 (1 January 1991); doi: 10.1117/12.51075
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 267 (1 January 1991); doi: 10.1117/12.51076
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 274 (1 January 1991); doi: 10.1117/12.51077
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 287 (1 January 1991); doi: 10.1117/12.51078
Image Metrology and 3-D Vision
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 294 (1 January 1991); doi: 10.1117/12.51079
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 301 (1 January 1991); doi: 10.1117/12.51080
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 314 (1 January 1991); doi: 10.1117/12.51081
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 323 (1 January 1991); doi: 10.1117/12.51082
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 332 (1 January 1991); doi: 10.1117/12.51083
Testing of Optical Components and Systems
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 25 (1 January 1991); doi: 10.1117/12.51084
Image Metrology and 3-D Vision
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 355 (1 January 1991); doi: 10.1117/12.51085
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 358 (1 January 1991); doi: 10.1117/12.51086
Fiber Optic and Laser Sensing I
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 366 (1 January 1991); doi: 10.1117/12.51087
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 377 (1 January 1991); doi: 10.1117/12.51088
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 399 (1 January 1991); doi: 10.1117/12.51089
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 409 (1 January 1991); doi: 10.1117/12.51090
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 421 (1 January 1991); doi: 10.1117/12.51091
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 431 (1 January 1991); doi: 10.1117/12.51092
Fiber Optic and Laser Sensing II
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 446 (1 January 1991); doi: 10.1117/12.51093
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 456 (1 January 1991); doi: 10.1117/12.51094
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 468 (1 January 1991); doi: 10.1117/12.51095
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 474 (1 January 1991); doi: 10.1117/12.51096
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 487 (1 January 1991); doi: 10.1117/12.51097
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 491 (1 January 1991); doi: 10.1117/12.51098
Optical Profiling of Surface Microtopography
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 504 (1 January 1991); doi: 10.1117/12.51099
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 515 (1 January 1991); doi: 10.1117/12.51100
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 530 (1 January 1991); doi: 10.1117/12.51101
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 537 (1 January 1991); doi: 10.1117/12.51102
Testing of Aspheric and Generalized Surfaces
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 85 (1 January 1991); doi: 10.1117/12.51103
Optical Profiling of Surface Microtopography
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 544 (1 January 1991); doi: 10.1117/12.51104
Submicron Distance Metrology
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 554 (1 January 1991); doi: 10.1117/12.51105
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 563 (1 January 1991); doi: 10.1117/12.51106
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 571 (1 January 1991); doi: 10.1117/12.51107
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 577 (1 January 1991); doi: 10.1117/12.51108
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 584 (1 January 1991); doi: 10.1117/12.51109
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 591 (1 January 1991); doi: 10.1117/12.51110
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 602 (1 January 1991); doi: 10.1117/12.51111
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 613 (1 January 1991); doi: 10.1117/12.51112
Novel Interferometric Metrology Devices
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 643 (1 January 1991); doi: 10.1117/12.51113
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 624 (1 January 1991); doi: 10.1117/12.51114
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 632 (1 January 1991); doi: 10.1117/12.51115
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 655 (1 January 1991); doi: 10.1117/12.51116
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 664 (1 January 1991); doi: 10.1117/12.51117
Fringe Analysis and Phase Measurement
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 678 (1 January 1991); doi: 10.1117/12.51118
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 690 (1 January 1991); doi: 10.1117/12.51119
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 696 (1 January 1991); doi: 10.1117/12.51120
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 704 (1 January 1991); doi: 10.1117/12.51121
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 720 (1 January 1991); doi: 10.1117/12.51122
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 731 (1 January 1991); doi: 10.1117/12.51123
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 738 (1 January 1991); doi: 10.1117/12.51124
Specialized Techniques and Applications I
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 750 (1 January 1991); doi: 10.1117/12.51125
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 767 (1 January 1991); doi: 10.1117/12.51126
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 757 (1 January 1991); doi: 10.1117/12.51127
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 775 (1 January 1991); doi: 10.1117/12.51128
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 792 (1 January 1991); doi: 10.1117/12.51129
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 798 (1 January 1991); doi: 10.1117/12.51130
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 802 (1 January 1991); doi: 10.1117/12.51131
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 808 (1 January 1991); doi: 10.1117/12.51132
Specialized Techniques and Applications II
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 826 (1 January 1991); doi: 10.1117/12.51133
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 835 (1 January 1991); doi: 10.1117/12.51134
Testing of Aspheric and Generalized Surfaces
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 115 (1 January 1991); doi: 10.1117/12.51135
Specialized Techniques and Applications I
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 783 (1 January 1991); doi: 10.1117/12.51136
Specialized Techniques and Applications II
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 850 (1 January 1991); doi: 10.1117/12.51137
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 862 (1 January 1991); doi: 10.1117/12.51138
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 868 (1 January 1991); doi: 10.1117/12.51139
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 877 (1 January 1991); doi: 10.1117/12.51054
Image Metrology and 3-D Vision
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 343 (1 January 1991); doi: 10.1117/12.51055
Holography and Holographic Interferometry
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 166 (1 January 1991); doi: 10.1117/12.51056
Novel Interferometric Metrology Devices
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 673 (1 January 1991); doi: 10.1117/12.51057
Optical Profiling of Surface Microtopography
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 525 (1 January 1991); doi: 10.1117/12.51058
Specialized Techniques and Applications I
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 820 (1 January 1991); doi: 10.1117/12.51059
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, pg 805 (1 January 1991); doi: 10.1117/12.51060
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