PROCEEDINGS VOLUME 1332
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING | 8-13 JULY 1990
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING
8-13 July 1990
San Diego, CA, United States
Testing of Optical Components and Systems
Proc. SPIE 1332, Absolute measurement of spherical surfaces, 0000 (1 January 1991); doi: 10.1117/12.51045
Proc. SPIE 1332, High-precision interferometric testing of spherical mirrors with long radius of curvature, 0000 (1 January 1991); doi: 10.1117/12.51046
Proc. SPIE 1332, Real-time wavefront measurement with lambda/10 fringe spacing for the optical shop, 0000 (1 January 1991); doi: 10.1117/12.51047
Proc. SPIE 1332, Simple test for the 90 degree angle in prisms, 0000 (1 January 1991); doi: 10.1117/12.51048
Proc. SPIE 1332, Set of two 45 - 90 - 45 prisms equivalent to the Fresnel rhomb, 0000 (1 January 1991); doi: 10.1117/12.51049
Proc. SPIE 1332, Focal length measurement using diffraction at a grating, 0000 (1 January 1991); doi: 10.1117/12.51050
Proc. SPIE 1332, Automatic inspection technique for optical surface flaws, 0000 (1 January 1991); doi: 10.1117/12.51051
Testing of Aspheric and Generalized Surfaces
Proc. SPIE 1332, Aspheric surface testing techniques, 0000 (1 January 1991); doi: 10.1117/12.51052
Proc. SPIE 1332, Interferometer for testing aspheric surfaces with electron-beam computer-generated holograms, 0000 (1 January 1991); doi: 10.1117/12.51053
Specialized Techniques and Applications II
Proc. SPIE 1332, Applications of diamond-turned null reflectors for generalized aspheric metrology, 0000 (1 January 1991); doi: 10.1117/12.51061
Testing of Aspheric and Generalized Surfaces
Proc. SPIE 1332, Optical aspheric surface profiler using phase shift interferometry, 0000 (1 January 1991); doi: 10.1117/12.51062
Proc. SPIE 1332, Aspheric testing using null mirrors, 0000 (1 January 1991); doi: 10.1117/12.51063
Holography and Holographic Interferometry
Proc. SPIE 1332, Application of real-time holographic interferometry in the nondestructive inspection of electronic parts and assemblies, 0000 (1 January 1991); doi: 10.1117/12.51064
Proc. SPIE 1332, White-light transmission holographic interferometry using chromatic corrective filters, 0000 (1 January 1991); doi: 10.1117/12.51065
Proc. SPIE 1332, TV holography and image processing in practical use, 0000 (1 January 1991); doi: 10.1117/12.51066
Proc. SPIE 1332, Holographic instrumentation for monitoring crystal growth in space, 0000 (1 January 1991); doi: 10.1117/12.51067
Proc. SPIE 1332, Van der Lugt optical correlation for the measurement of leak rates of hermetically sealed packages, 0000 (1 January 1991); doi: 10.1117/12.51068
Proc. SPIE 1332, Holographic interferometry in corrosion studies of metals: I. Theoretical aspects, 0000 (1 January 1991); doi: 10.1117/12.51069
Proc. SPIE 1332, Holographic interferometry in corrosion studies of metals: II. Applications, 0000 (1 January 1991); doi: 10.1117/12.51070
Proc. SPIE 1332, Numerical investigation of effect of dynamic range and nonlinearity of detector on phase-stepping holographic interferometry, 0000 (1 January 1991); doi: 10.1117/12.51071
Holography and Phase Conjunction
Proc. SPIE 1332, Holography with a single picosecond pulse, 0000 (1 January 1991); doi: 10.1117/12.51072
Proc. SPIE 1332, Holographic measurement of the angular error of a table moving along a slideway, 0000 (1 January 1991); doi: 10.1117/12.51073
Proc. SPIE 1332, Optical testing by dynamic holographic interferometry with photorefractive crystals and computer image processing, 0000 (1 January 1991); doi: 10.1117/12.51074
Proc. SPIE 1332, Optical phase-conjugate resonators, bistabilities, and applications, 0000 (1 January 1991); doi: 10.1117/12.51075
Proc. SPIE 1332, Phase-conjugate interferometry by using dye-doped polymer films, 0000 (1 January 1991); doi: 10.1117/12.51076
Proc. SPIE 1332, Phase-conjugate Twyman-Green interferometer for testing conicoidal surfaces, 0000 (1 January 1991); doi: 10.1117/12.51077
Proc. SPIE 1332, Nondestructive testing of printed circuit board by phase-shifting interferometry, 0000 (1 January 1991); doi: 10.1117/12.51078
Image Metrology and 3-D Vision
Proc. SPIE 1332, Industrial applications of optical fuzzy syntactic pattern recognition, 0000 (1 January 1991); doi: 10.1117/12.51079
Proc. SPIE 1332, Absolute range measurement system for real-time 3-D vision, 0000 (1 January 1991); doi: 10.1117/12.51080
Proc. SPIE 1332, New stereo laser triangulation device for specular surface inspection, 0000 (1 January 1991); doi: 10.1117/12.51081
Proc. SPIE 1332, Visual inspection system using multidirectional 3-D imager, 0000 (1 January 1991); doi: 10.1117/12.51082
Proc. SPIE 1332, Real-time edge extraction by active defocusing, 0000 (1 January 1991); doi: 10.1117/12.51083
Testing of Optical Components and Systems
Proc. SPIE 1332, System calibration and part alignment for inspection of 2-D electronic circuit patterns, 0000 (1 January 1991); doi: 10.1117/12.51084
Image Metrology and 3-D Vision
Proc. SPIE 1332, Algorithm for the generation of look-up range table in 3-D sensing, 0000 (1 January 1991); doi: 10.1117/12.51085
Proc. SPIE 1332, Information extracting and application for the combining objective speckle and reflection holography, 0000 (1 January 1991); doi: 10.1117/12.51086
Fiber Optic and Laser Sensing I
Proc. SPIE 1332, Surface inspection using optical fiber sensor, 0000 (1 January 1991); doi: 10.1117/12.51087
Proc. SPIE 1332, Fiber optic smart structures: structures that see the light, 0000 (1 January 1991); doi: 10.1117/12.51088
Proc. SPIE 1332, Near real-time operation of a centimeter-scale distributed fiber sensing system, 0000 (1 January 1991); doi: 10.1117/12.51089
Proc. SPIE 1332, Geometric measurement of optical fibers with pulse-counting method, 0000 (1 January 1991); doi: 10.1117/12.51090
Proc. SPIE 1332, Interferometric fiber optic sensors for use with composite materials, 0000 (1 January 1991); doi: 10.1117/12.51091
Proc. SPIE 1332, Fiber optic damage detection for an aircraft leading edge, 0000 (1 January 1991); doi: 10.1117/12.51092
Fiber Optic and Laser Sensing II
Proc. SPIE 1332, Low- cost fiber optic sensing systems using spatial division multiplexing, 0000 (1 January 1991); doi: 10.1117/12.51093
Proc. SPIE 1332, Two-dimensional micropattern measurement using precision laser beam scanning, 0000 (1 January 1991); doi: 10.1117/12.51094
Proc. SPIE 1332, GRIN fiber lens connectors, 0000 (1 January 1991); doi: 10.1117/12.51095
Proc. SPIE 1332, Laser-based triangulation techniques in optical inspection of industrial structures, 0000 (1 January 1991); doi: 10.1117/12.51096
Proc. SPIE 1332, Application of fiber optic sensors in pavement maintenance, 0000 (1 January 1991); doi: 10.1117/12.51097
Proc. SPIE 1332, Laser ultrasonics: generation and detection considerations for improved signal-to-noise ratio, 0000 (1 January 1991); doi: 10.1117/12.51098
Optical Profiling of Surface Microtopography
Proc. SPIE 1332, Effects of the nonvanishing tip size in mechanical profile measurements, 0000 (1 January 1991); doi: 10.1117/12.51099
Proc. SPIE 1332, Three-dimensional nanoprofiling of semiconductor surfaces, 0000 (1 January 1991); doi: 10.1117/12.51100
Proc. SPIE 1332, Laser moire topography for 3-D contour measurement, 0000 (1 January 1991); doi: 10.1117/12.51101
Proc. SPIE 1332, Nomarski viewing system for an optical surface profiler, 0000 (1 January 1991); doi: 10.1117/12.51102
Testing of Aspheric and Generalized Surfaces
Proc. SPIE 1332, Rigorous optical theory of the D Sight phenomenon, 0000 (1 January 1991); doi: 10.1117/12.51103
Optical Profiling of Surface Microtopography
Proc. SPIE 1332, Surface microtopography of thin silver films, 0000 (1 January 1991); doi: 10.1117/12.51104
Submicron Distance Metrology
Proc. SPIE 1332, Design criteria of an integrated optics microdisplacement sensor, 0000 (1 January 1991); doi: 10.1117/12.51105
Proc. SPIE 1332, Laser-scanning tomography and related dark-field nanoscopy method, 0000 (1 January 1991); doi: 10.1117/12.51106