Automatic, high-resolution analysis of low-noise fringes

Gordon D. Lassahn

doi:10.1117/12.51119

1 January 1991 Automatic, high-resolution analysis of low-noise fringes

Gordon D. Lassahn

Proceedings Volume 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection; (1991) https://doi.org/10.1117/12.51119
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

We outline a fringe analysis algorithm that is completely automatic and has been demonstrated to give individual pixel resolution with good accuracy for very general types of fringe patterns, but is slow and quite sensitive to noise in the raw fringe image.

Citation Download Citation

Gordon D. Lassahn "Automatic, high-resolution analysis of low-noise fringes", Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); https://doi.org/10.1117/12.51119

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KEYWORDS

Fringe analysis

Optical testing

Pixel resolution

Optical inspection

Diffraction

Algorithm development

Diffraction gratings

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