1 January 1991 Automatic, high-resolution analysis of low-noise fringes
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Abstract
We outline a fringe analysis algorithm that is completely automatic and has been demonstrated to give individual pixel resolution with good accuracy for very general types of fringe patterns, but is slow and quite sensitive to noise in the raw fringe image.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gordon D. Lassahn, "Automatic, high-resolution analysis of low-noise fringes", Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51119; https://doi.org/10.1117/12.51119
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KEYWORDS
Fringe analysis

Optical testing

Pixel resolution

Optical inspection

Diffraction

Algorithm development

Diffraction gratings

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