1 January 1991 Laser-based triangulation techniques in optical inspection of industrial structures
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Abstract
An optical triangulation technique using a solid state laser diode sourceand detector, providing sub-pixel resolution on a CCD detector was developed and is discussed. A novel approach to the problem of non-linear accuracy is outlined. Results of extensive research into improving the accuracy of the device with particular reference to configuration, optical components, the laser source, linearity, resolution, calibration and interpolation are presented.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Timothy A. Clarke, Kenneth T. V. Grattan, N. E. Lindsey, "Laser-based triangulation techniques in optical inspection of industrial structures", Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51096; https://doi.org/10.1117/12.51096
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