Nondestructive testing of printed circuit board by phase-shifting interferometry

Yueguang Lu; Lingzhen Jiang; Lixun Zou; Xia Zhao; Junyong Sun

doi:10.1117/12.51078

1 January 1991 Nondestructive testing of printed circuit board by phase-shifting interferometry

Yueguang Lu, Lingzhen Jiang, Lixun Zou, Xia Zhao, Junyong Sun

Proceedings Volume 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection; (1991) https://doi.org/10.1117/12.51078
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

In the paper, the principle of phase shifting interferometry has been briefly described. B using this technique to the non-destructive testing of solder joints on printed circuit board, the defective solder joints can be easily distinguished b the phase changes on the joints. A suitable aglorithm for the processing of the interferogram was also given. Keywords: Holographic interferometry, Non-destructive testing Phase-sh I ft

Citation Download Citation

Yueguang Lu, Lingzhen Jiang, Lixun Zou, Xia Zhao, and Junyong Sun "Nondestructive testing of printed circuit board by phase-shifting interferometry", Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); https://doi.org/10.1117/12.51078

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