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1 January 1991 Nondestructive testing of printed circuit board by phase-shifting interferometry
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In the paper, the principle of phase shifting interferometry has been briefly described. B using this technique to the non-destructive testing of solder joints on printed circuit board, the defective solder joints can be easily distinguished b the phase changes on the joints. A suitable aglorithm for the processing of the interferogram was also given. Keywords: Holographic interferometry, Non-destructive testing Phase-sh I ft
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yueguang Lu, Lingzhen Jiang, Lixun Zou, Xia Zhao, and Junyong Sun "Nondestructive testing of printed circuit board by phase-shifting interferometry", Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991);

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