PROCEEDINGS VOLUME 1333
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING | 8-13 JULY 1990
Advanced Optical Manufacturing and Testing
IN THIS VOLUME

7 Sessions, 35 Papers, 0 Presentations
Profilometry  (7)
Metrology I  (4)
Metrology II  (4)
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING
8-13 July 1990
San Diego, CA, United States
Advanced Optical Fabrication I
Proc. SPIE 1333, Automation for optics manufacturing, 0000 (1 November 1990); https://doi.org/10.1117/12.22784
Proc. SPIE 1333, Way to nanogrinding technology, 0000 (1 November 1990); https://doi.org/10.1117/12.22785
Proc. SPIE 1333, Demonstration of an ion-figuring process, 0000 (1 November 1990); https://doi.org/10.1117/12.22786
Proc. SPIE 1333, Rapid optical fabrication with CCOS, 0000 (1 November 1990); https://doi.org/10.1117/12.22787
Proc. SPIE 1333, Rapid, noncontact optical figuring of aspheric surfaces with plasma-assisted chemical etching, 0000 (1 November 1990); https://doi.org/10.1117/12.22788
Proc. SPIE 1333, High-quality diamond turning, 0000 (1 November 1990); https://doi.org/10.1117/12.22789
Advanced Optical Fabrication II
Proc. SPIE 1333, Some reflections on x-ray optics, 0000 (1 November 1990); https://doi.org/10.1117/12.22791
Proc. SPIE 1333, Optical fabrication - process modeling - analysis tool box, 0000 (1 November 1990); https://doi.org/10.1117/12.22793
Proc. SPIE 1333, Three-dimensional contouring on a numerically controlled grinder, 0000 (1 November 1990); https://doi.org/10.1117/12.22794
Proc. SPIE 1333, Ductile regime grinding of glass and other brittle materials by the use of ultrastiff machine tools, 0000 (1 November 1990); https://doi.org/10.1117/12.22795
Proc. SPIE 1333, Fabrication and test of the grazing-incidence supersmooth precision cylindrical mirror, 0000 (1 November 1990); https://doi.org/10.1117/12.22796
Profilometry
Proc. SPIE 1333, Optimizing a deep-UV projection lens with a 442-nm interferometer, 0000 (1 November 1990); https://doi.org/10.1117/12.22798
Proc. SPIE 1333, Noncontact precision measurement system, 0000 (1 November 1990); https://doi.org/10.1117/12.22799
Proc. SPIE 1333, Novel noncontact profiler design for measuring synchrotron radiation mirrors, 0000 (1 November 1990); https://doi.org/10.1117/12.22800
Proc. SPIE 1333, Robust, sub-angstrom-level midspatial-frequency profilometry, 0000 (1 November 1990); https://doi.org/10.1117/12.22802
Proc. SPIE 1333, Stylus profilometry of large optics, 0000 (1 November 1990); https://doi.org/10.1117/12.22803
Proc. SPIE 1333, Laser diode technologies for in-process metrology, 0000 (1 November 1990); https://doi.org/10.1117/12.22804
Proc. SPIE 1333, In search of the elusive true surface, 0000 (1 November 1990); https://doi.org/10.1117/12.22805
Profilometry and Thin Film Coating
Proc. SPIE 1333, Robust, angstrom level circularity profilometry, 0000 (1 November 1990); https://doi.org/10.1117/12.22807
Proc. SPIE 1333, Circumferential and inner diameter metrology for the Advanced X-ray Astrophysics Facility optics, 0000 (1 November 1990); https://doi.org/10.1117/12.22808
Proc. SPIE 1333, On-machine measurement of roughness, waviness, and flaws, 0000 (1 November 1990); https://doi.org/10.1117/12.22809
Proc. SPIE 1333, Measurements of x-ray reflectivities of Au-coatings at several energies, 0000 (1 November 1990); https://doi.org/10.1117/12.22811
Proc. SPIE 1333, Platinum coating of an x-ray mirror for SR lithography, 0000 (1 November 1990); https://doi.org/10.1117/12.22813
Metrology I
Proc. SPIE 1333, In-process metrology for large astronomical mirrors, 0000 (1 November 1990); https://doi.org/10.1117/12.22814
Proc. SPIE 1333, Hilbert transform algorithm for fringe-pattern analysis, 0000 (1 November 1990); https://doi.org/10.1117/12.22815
Metrology II
Proc. SPIE 1333, Angstrom level profilometry for submillimeter- to meter-scale surface errors, 0000 (1 November 1990); https://doi.org/10.1117/12.22817
Proc. SPIE 1333, In-process mirror figure qualification procedure for large deformable mirrors, 0000 (1 November 1990); https://doi.org/10.1117/12.22818
Proc. SPIE 1333, Interferometric evaluation of lenslet arrays for 2-D phase-locked laser diode sources, 0000 (1 November 1990); https://doi.org/10.1117/12.22819
Proc. SPIE 1333, New optical design of exposure system: algorithm for designing irradiating lens and design of exposure system for use in liquid crystal display, 0000 (1 November 1990); https://doi.org/10.1117/12.22820
Metrology III
Proc. SPIE 1333, AXAF precision metrology mount, 0000 (1 November 1990); https://doi.org/10.1117/12.22823
Proc. SPIE 1333, Manufacturing and metrology tooling for the Solar-A Soft X-Ray Telescope, 0000 (1 November 1990); https://doi.org/10.1117/12.22824
Metrology I
Proc. SPIE 1333, Correlation of RTV properties to test data and its effect on the AXAF mirror performance, 0000 (1 November 1990); https://doi.org/10.1117/12.22826
Proc. SPIE 1333, Structural error sources during fabrication of the AXAF optical elements, 0000 (1 November 1990); https://doi.org/10.1117/12.22827
Advanced Optical Fabrication II
Proc. SPIE 1333, Laser-scanning lens configurations, 0000 (1 November 1990); https://doi.org/10.1117/12.22828
Advanced Optical Fabrication I
Proc. SPIE 1333, Transition between brittle and ductile mode in loose abrasive grinding, 0000 (1 November 1990); https://doi.org/10.1117/12.22829
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