1 November 1990 Measurements of x-ray reflectivities of Au-coatings at several energies
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We present the results of an extensive study of X-ray reflectivities of dip lacquered and Au coated Al foils. The measurements are performed at four different energies from 0.71 keV to 8.1 keV. The foils span a range of fabrication parameters. We show, that two of three examined versions of a density variation model are able to explain the data. We fmd a strong dependence on the microroughness of thickness of the Au coating and of the Au deposition rates. We present data suggesting important correspondence between X-ray measurements and scanning tunneling microscopy measurements. We fmd no dependence on curing temperatures (70°C to 130°C). Finally, we have performed an energy scan of one of the foils, in the range 6 keV to 12 keV.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Allan Hornstrup, Allan Hornstrup, Finn Erland Christensen, Finn Erland Christensen, Jorgen Garnaes, Jorgen Garnaes, Ellen Jespersen, Ellen Jespersen, Shou-Hua Zhu, Shou-Hua Zhu, Herbert W. Schnopper, Herbert W. Schnopper, "Measurements of x-ray reflectivities of Au-coatings at several energies", Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); doi: 10.1117/12.22811; https://doi.org/10.1117/12.22811


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