1 November 1990 Noncontact precision measurement system
Author Affiliations +
Abstract
A gage is being developed to make precision measurements of moving surfaces in a manufacturing environment. A prototype has demonstrated submicron repeatability and accuracy at the 2- to 6-micron level as well as the ability to measure parts moving at about 1 in./min. The system is described, and the means to make the accuracy comparable to the repeatability and to increase part velocity to more than 200 in./min are indicated.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ronald Gamache, John Tourtellott, John F. Wagner, "Noncontact precision measurement system", Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); doi: 10.1117/12.22799; https://doi.org/10.1117/12.22799
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT


Back to Top