1 November 1990 Noncontact precision measurement system
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Abstract
A gage is being developed to make precision measurements of moving surfaces in a manufacturing environment. A prototype has demonstrated submicron repeatability and accuracy at the 2- to 6-micron level as well as the ability to measure parts moving at about 1 in./min. The system is described, and the means to make the accuracy comparable to the repeatability and to increase part velocity to more than 200 in./min are indicated.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ronald Gamache, Ronald Gamache, John Tourtellott, John Tourtellott, John F. Wagner, John F. Wagner, } "Noncontact precision measurement system", Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); doi: 10.1117/12.22799; https://doi.org/10.1117/12.22799
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