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1 November 1990 Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring
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Abstract
Surface-enhanced Raman spectroscopy is being evaluated for use as an advanced method for detecting organic contaminants in groundwater during field-screening of environmental samples. The SERS technique offers attractive and unique capabilities for detecting a wide range of organic contaminants in aqueous environments at ppm to ppb levels. An inexpensive computer-controlled portable spectrometer system coupled to a fiberoptic probe has been developed for rapid on-site and in situ determination of organic contamination in groundwater. Applications of recent advances in substrate fabrication for use with environmental samples are discussed, and critical issues pertaining to substrate durability, repeatability, sensitivity, selectivity and universality are addressed.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric A. Wachter, John W. Haas, David R. James, Richard B. Gammage, Trinidad L. Ferrell, and Tuan Vo-Dinh "Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring", Proc. SPIE 1336, Raman and Luminescence Spectroscopies in Technology II, (1 November 1990); doi: 10.1117/12.22916; https://doi.org/10.1117/12.22916
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