Paper
1 November 1990 128x128 InGaAs detector array for 1.0-1.7 μm
Gregory H. Olsen, Abhay M. Joshi, M. J. Lange, K. M. Woodruff, E. Mykietyn, D. G. Gay, G. C. Erickson, Donald A. Ackley, Vladimir S. Ban, Craig O. Staller
Author Affiliations +
Abstract
A two-dimensional 128 x 128 detector array for the 1.0 - 1.7 micron spectral region has been demonstrated with indium gallium arsenide. The 30 micron square pixels had 60 micron spacing in both directions and were designed to be compatible with a 2D Reticon multiplexer. Dark currents below 100 pA, capacitance near 0.1 pF, and quantum efficiencies above 80 percent were measured. Probe maps of dark current and quantum efficiency are presented along with pixel dropout data and wafer yield which was as high as 99.89 percent (7 dropouts) in an area of 6528 pixels and 99.37 percent (103 dropouts) over an entire 128 x 128 pixel region.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gregory H. Olsen, Abhay M. Joshi, M. J. Lange, K. M. Woodruff, E. Mykietyn, D. G. Gay, G. C. Erickson, Donald A. Ackley, Vladimir S. Ban, and Craig O. Staller "128x128 InGaAs detector array for 1.0-1.7 μm", Proc. SPIE 1341, Infrared Technology XVI, (1 November 1990); https://doi.org/10.1117/12.23121
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CITATIONS
Cited by 8 scholarly publications and 1 patent.
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KEYWORDS
Semiconducting wafers

Detector arrays

Indium gallium arsenide

Sensors

Quantum efficiency

Infrared technology

Capacitance

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