1 February 1991 Recent developments in production of thin x-ray reflecting foils
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Abstract
Progress in the development of high quality X-ray reflecting foils for high throughput X-ray imaging experiments is briefly given and discussed.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rene Hudec, Rene Hudec, Boris Valnicek, Boris Valnicek, J. Cervencl, J. Cervencl, T. Gerstman, T. Gerstman, Adolf Van Inneman, Adolf Van Inneman, Pavel Nejedly, Pavel Nejedly, Lubomir Svatek, Lubomir Svatek, } "Recent developments in production of thin x-ray reflecting foils", Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); doi: 10.1117/12.23189; https://doi.org/10.1117/12.23189
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