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1 February 1991 Ultra-High-Resolution XUV Spectroheliograph II: predicted performance
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Abstract
The phenomena to be studied with the Ultra-High Resolution XUV Spectroheliograph (UHRXS) which will be included into the instrumental load of the Space Station Freedom are discussed together with the characteristics of the nine multilayer Ritchey-Chretien telescopes constituting the UHRXS system. The telescopes will cover a spectral range from about 70 A to about 300 A. Each telescope will be able to isolate emission line multiplets excited over a narrow temperature range, providing images of diagnostic quality covering structures in the solar atmosphere ranging from T of about 50,000 K to 30,000,000 K. One of the nine UHRXS telescopes is configured as a coronagraph to allow observations to 6 solar radii beyond the solar limb. The paper presents an analysis of the expected sensitivity and resolving power of the UHRXS telescopes, and the diagnostic response of the various UHRXS instruments to structures in the solar atmosphere between 10,000 K and 100,000,000 K.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Arthur B. C. Walker II, Joakim F. Lindblom, J. Gethyn Timothy, Maxwell J. Allen, Craig Edward DeForest, Charles C. Kankelborg, Ray H. O'Neal, Elizabeth S. Paris, Thomas D. Willis, Troy W. Barbee Jr., and Richard B. Hoover "Ultra-High-Resolution XUV Spectroheliograph II: predicted performance", Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); https://doi.org/10.1117/12.23204
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