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1 November 1990 Background reduction in microchannel plates
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Abstract
The source of an observed diffuse, time-varying structured background component in both bare and coated microchannel plates (MPCs) is investigated. The effects of MCP operating voltages, MCP gain characteristics, pressure, electrical contacts, and physical shielding on this background component are addressed. Various techniques to reduce this background are considered.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John H. Chappell, Rachel K. Martin, Stephen S. Murray, and Martin V. Zombeck "Background reduction in microchannel plates", Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); https://doi.org/10.1117/12.23249
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